Details

---

 

The S neox sensor pushes versatility to the extreme: our 4-in-1 technology, provides unparalleled adaptability for changing application requirements, and maximum measurement flexibility on any surface.

         
 

The re-design of some algorithms has increased the speed and capability of all technologies.

 

The option to add a piezoelectric Z motor makes the S neox our top performer. The S neox sensor also covers thicknesses measurements from 50 nm to 5 mm.

           

 

Our equipment has the functionality of finding the best acquisition settings for your measurement: just focus on the surface and S neox will do the rest.

             


 

mm (inches)
Weight: 8.3 Kg  (18.4 lbs)

             
 

                                                                                                      

                                                                     Confocal                 Interferometry            Ai Focus Variation 
                                                                                                      PSI | ePSI | CSI

 

 

 

                                                                                                                             

                                                                         630 nm                   530 nm                  460 nm                  575 nm

 

 

 

• Brightfield

MAG	5X	10X	20X	50X	100X	150X
NA	0.15	0.30	0.45	0.80	0.90	0.90
WD (mm)	23.5	17.5	4.5	1.0	1.0	1.5
FOV1 (µm)	3378 x 2826	1689 x 1413	845 x 707	338 x 283	169 x 141	113 x 94
Spatial sampling2 (µm)	1.38	0.69	0.34	0.13	0.07	0.05
Optical resolution3 (µm)	0.94	0.47	0.31	0.18	0.16	0.16
System noise4 (nm)	100	30	8	4	3	2
Maximum slope5 (º)	9	17	27	53	64	64

1 Maximum field of view with 3/2” camera and 0.5X optics.   2 Pixel size on the surface.   3 L&S: Line and Space. Values for blue LED.   4 System noise measured as the difference between two consecutive measures on a calibration mirror placed perpendicular to the optical axis.   5 On smooth surfaces, up to 71º. On scattering surfaces, up to 86º.

• Interferometry

MAG	2.5X	5X	10X	20X	50X	100X
NA	0.075	0.13	0.30	0.40	0.55	0.70
WD (mm)	10.3	9.3	7.4	4.7	3.4	2.0
FOV1 (µm)	6756 x 5652	3378 x 2826	1689 x 1413	845 x 707	338 x 283	169 x 141
Spatial sampling2 (µm)	2.76	1.38	0.69	0.34	0.13	0.07
Optical resolution3 (µm)	1.87	1.08	0.47	0.35	0.26	0.20
System noise4 (nm)	PSI / ePSI   0.1 nm  (0.01 nm with PZT)        CSI 1 nm
Maximum slope5 (º)	4	7	17	24	33	44

1 Maximum field of view with 3/2” camera and 0.5X optics.   2 Pixel size on the surface.   3 L&S: Line and Space. Values for blue LED.   4 System noise measured as the difference between two consecutive measures on a calibration mirror placed perpendicular to the optical axis. For PSI, 10 phase averages with vibration isolation activated. The 0.01 nm are achieved with Piezo stage scanner and temperature controlled room. Values for green LED (white LED for CSI). Resolution HD.   5 On smooth surfaces, up to 71º. On scattering surfaces, up to 86º.

Z	COARSE (Linear stage)	FINE (Piezoelectric scanner with capacitive sensor)
Vertical range	40 mm	200 µm
Resolution	5 nm	1.25 nm

 

Standard	Value	U, σ	Technique
Step height	48600 nm	U=300 nm, σ= 10 nm	Confocal & CSI
	7616 nm	U=79 nm, σ= 5 nm	Confocal & CSI
	941.6 nm	U=7 nm, σ= 1 nm	Confocal & CSI
	186 nm	U=4 nm, σ= 0.4 nm	Confocal & CSI
	44.3 nm	U=0.5 nm, σ= 0.1 nm	PSI
	10.8 nm	U=0.5 nm, σ= 0.05 nm	PSI
Areal roughness (Sa)7	0.79 µm	U=0.04 µm, σ=0.0005 µm	Confocal, AiFV & CSI
Profile roughness (Ra)8	2.40 µm	U=0.03 µm, σ= 0.002 µm	Confocal, AiFV & CSI
	0.88 µm	U=0.015 µm, σ= 0.0005 µm	Confocal, AiFV & CSI
	0.23 µm	U=0.005 µm, σ= 0.0002 µm	Confocal, AiFV & CSI

Objective lense used for Confocal and Ai Focus Variation 50X 0.80 NA and for CSI and PSI 50X 0.55NA.
Resolution 1220×1024 pixels. All measurements are done using PZT.
Uncertainty (U) according to ISO/IEC guide 98-3:2008 GUM:1995, K=1,96 (level of confidence 95%).
σ according to 25 measures.
7 Area of 1x1mm.   8 Profile of 4mm length.