radFA - Wafer Bernoulli Wand Series 

~ Wafer Handling - Based on Bernoulli's Principle 
~ Cleanroom Compability - To maintain cleanliness 
~ Low Particle Generation - Minimizing Contamination 
~ Reduced Risk - Wafer damage or Breakage
~ Efficient Handling - For Semiconductor Manufacturing Process 
~ Buzzer Alarm - When Pressure is Low / High