Sensofar - New S Neox 6 3D Optical Profiler

S Neox 6
3D Optical Profiler


The S neox 6 is a multi-technology 3D optical profiler for non-contact surface measurement, roughness analysis, dimensional inspection, and thin-film characterization. Combining complementary 3D optical metrology techniques helps laboratories and industrial teams measure a wider range of surfaces with greater speed, precision, and control

Measure more surfaces with one optical profiler

Performance beyond specifications

Obtain precise 3D surface data through refined optical design, enhanced imaging, high-speed acquisition, and advanced algorithms. 

S neox 6 3D Optical Profiler - Performance
 

Faster from inspection 
to analysis

Reduce measurement time with smart automation, streamlined acquisition, enhanced processing, and more fluid data interaction.

S neox 6 3D Optical Profiler - Speed
 

Versatility that drives productivity

Adapt the measurement approach to each sample with multi-technology capability, motorized positioning, and flexible system configurations.

S neox 6 3D Optical Profiler - Versatility

One system, multiple measurement technologies

S neox 6 AiFV Technology
Ai Focus Variation icon

Ai Focus Variation 

Enables efficient 3D shape measurement over large, rough, and steep surfaces by combining focus-based optical profiling with active illumination. 

Confocal

Delivers high lateral resolution for 3D surface measurement across smooth to very rough surfaces. 

Interferometry

Provides exceptional height resolution for precise measurement, with PSI, ePSI, and CSI modes. 

Spectroscopic Reflectometry

Measure transparent thin films and layered materials quickly and non-destructively. 

 

Higher throughput, simpler operation

S neox 6 Applications and users

The S neox 6 accelerates inspection, acquisition, and analysis through a complete in-house software ecosystem. From sample navigation and measurement to automation, analysis, and reporting, each stage of the workflow is designed to help users work more efficiently and spend less time on each measurement. 

 

Sep 06,2026